Date: 01 - 05 Sep, 2019
Booth: Join arivis colleagues at the ZEISS booth
This conference follows the tradition of the conference series of the German Society for Electron Microscopy (DGE) in aiming to attract students new in the field of electron microscopy, technicians looking for the latest equipment and scientific methods, and also experienced scientists and world-renowned experts exchanging ideas and establishing new collaborations.
See our patent pending Virtual Reality software InViewR to create, edit & split segments interactively in VR space to obtain more accurate results even in dense samples. To reserve your own slot for a demonstration book your slot here.
Join us at MC 2019
If you would like to speak to us in advance please feel free to contact us:
Dependence North America
Sunday, 2019, September 1 to Thursday, 2019, September 5