Productronica 2009: Presentation of new microscope μ-SIS by WENO

At this year’s Productronica 2009, the WENO GmbH will present their new microscope µ-SIS, which, in combination with the arivis bowser, provides an option for large image date processing.
Due to its flexible composability, the system can be adapted for various applications: wafer production, solar cell control, solar modules, thin layer examination, surface check and print image characterization.

“The µ-SIS makes it possible to carry out industrial quality check ups below a resolution of 1µm. The AMBIS™, a patent of Muenster University, realizes the image acquisition without stopping the microscope table. With the help of a special camera system, for example a line scan camera, areas that arouse suspicion can be detected and transmitted as coordinates to the microscope. Using an axis system (patent pending) one is then able to inspect certain areas in-inline. Individual lighting concepts ensure the optimal illumination of different surfaces.”

Thin layer sensors that provide an image size of about 150 Mbyte are used to create “LIFE-recordings”.
As other highlights, WENO presents solutions for PV-processes as video recordings from its showroom:

• microscope inspection of wafers and solar cells
• non-contact transport in combination with a line scan camera inspection
• line scan camera inspection of solar modules for controlling outgoing goods?

The Productronica is the world’s leading exhibition for innovative electronics and is taking place from September 10th to September 13th 2009 in Munich. WENO is presenting its microscope µ-SIS in hall 2, booth 133.